MIL-DTL-87104C
4.6.2.5.2 Procedure.
a.
The test setup shall be energized without the test sample to insure that it is corona-free a minimum of 1,000
volts above the test voltage required for the corona test and does not breakdown at 1,000 volts above the
test voltage required for the high potential test at the specified test altitude. (See applicable detail
specification.)
b.
The chamber shall be returned to room ambient conditions and the assembly shall be inserted in the test
setup with corona-free mating connectors attached to each end of the coaxial assembly under test.
(Sealant material shall not be used in either the mating connector or the connector on the assembly under
test.)
c.
The test setup shall be as required to apply voltage between the inner conductor and the outer conductor of
the assembly.
d.
The barometric pressure shall be decreased in the chamber to the condition specified in 4.6.2.5.1.2 and
maintained at that altitude for 1 hour.* (*For production testing, the chamber time shall be 15 minutes.)
e.
At the end of the 1-hour period, the voltage shall be slowly increased at a maximum rate of 500 volts per
second to the test voltage required for the high potential and corona test as specified in the detail
specification and maintained for 1 minute while monitoring the fault indicator for evidence of a disruptive
discharge and leakage current.
f.
The test voltage shall be slowly decreased until corona is extinguished.
g.
The coaxial assembly shall be subjected to the examination of product, procedure II (see 4.6.1.2).
4.6.2.5.3 Accept-reject criteria (see 3.5.1.7). The coaxial assembly shall be considered to have passed the
altitude compliance test if:
a.
There is no evidence of breakdown while the voltage is being applied.
b.
The corona extinction level is equal to, or greater than, that specified in the detail specification.
The assembly passes the accept-reject criteria specified in 4.6.1.2.2.
c.
4.6.2.6 Power handling capability test (see 3.5.1.8). The power handling capability of the test sample shall be
determined by subjecting the assembly to rated power at the altitudes and temperatures specified herein.
4.6.2.6.1 Test setup.
4.6.2.6.1.1 Test equipment. A temperature-altitude chamber, high power terminations, a power source, and
associated instrumentation shall be required.
4.6.2.6.1.2 Test conditions.
a.
Temperature sensing devices (see 4.3.2) shall be used to measure chamber and test sample conditions,
and chamber and test sample conditions shall be stabilized (see 4.3.1.3) prior to each step in the test
program.
b.
The upper frequency used shall be within 10 percent of the upper frequency limit of the sample under test.
The lower frequency shall be within 0.10 GHz of the low end of the band, and the third frequency shall be
the approximate center of the frequency range.
c.
If a peak power rating is specified in the detail specification, the assembly shall be subjected to the peak
power rating for 1 hour at a frequency within 10 percent of the high end of the band.
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